目前，我國電(dian)(dian)(dian)(dian)力(li)系統的(de)電(dian)(dian)(dian)(dian)源(yuan)中性(xing)點(dian)一(yi)般是(shi)(shi)不直接(jie)接(jie)地(di)(di)(di)的(de)，所以(yi)當(dang)(dang)線路(lu)(lu)單相(xiang)接(jie)地(di)(di)(di)時流過(guo)(guo)(guo)故障點(dian)的(de)電(dian)(dian)(dian)(dian)流實際是(shi)(shi)線路(lu)(lu)對(dui)地(di)(di)(di)電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)產生(sheng)的(de)電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)電(dian)(dian)(dian)(dian)流。據(ju)統計，電(dian)(dian)(dian)(dian)力(li)系統的(de)故障很大(da)程度是(shi)(shi)由于線路(lu)(lu)單相(xiang)接(jie)地(di)(di)(di)時電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)電(dian)(dian)(dian)(dian)流過(guo)(guo)(guo)大(da)導致起弧(hu)(hu)(hu)且電(dian)(dian)(dian)(dian)弧(hu)(hu)(hu)無法(fa)自行(xing)熄弧(hu)(hu)(hu)引起的(de)。因此，我國的(de)電(dian)(dian)(dian)(dian)力(li)規程規定(ding)當(dang)(dang)10kV和35kV系統電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)電(dian)(dian)(dian)(dian)流分別大(da)于30A和10A時，應裝設消弧(hu)(hu)(hu)線圈以(yi)補償電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)電(dian)(dian)(dian)(dian)流，這就(jiu)要求對(dui)其電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)電(dian)(dian)(dian)(dian)流進(jin)行(xing)測量以(yi)做決定(ding)。另外(wai)，電(dian)(dian)(dian)(dian)力(li)系統的(de)對(dui)地(di)(di)(di)電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)和PT的(de)參數配(pei)合會產生(sheng)PT鐵磁諧(xie)振過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)壓，為了驗證該配(pei)電(dian)(dian)(dian)(dian)系統是(shi)(shi)否會發生(sheng)PT諧(xie)振及發生(sheng)什么性(xing)質的(de)諧(xie)振，也必須準確測量電(dian)(dian)(dian)(dian)力(li)系統的(de)對(dui)地(di)(di)(di)電(dian)(dian)(dian)(dian)容(rong)(rong)(rong)值(zhi)。

傳(chuan)統(tong)的(de)測(ce)(ce)(ce)量(liang)(liang)電(dian)(dian)(dian)(dian)容(rong)(rong)電(dian)(dian)(dian)(dian)流(liu)的(de)方法(fa)有單相金屬接地的(de)直(zhi)接法(fa)、外加電(dian)(dian)(dian)(dian)容(rong)(rong)間接測(ce)(ce)(ce)量(liang)(liang)法(fa)等，這些方法(fa)都要接觸到一次設備，因(yin)而存在試驗(yan)危險(xian)、操(cao)作(zuo)繁雜(za)，工(gong)作(zuo)效率低等缺點。進而出現(xian)了在PT二(er)次側注入信號(hao)(hao)法(fa)測(ce)(ce)(ce)量(liang)(liang)電(dian)(dian)(dian)(dian)網電(dian)(dian)(dian)(dian)容(rong)(rong)電(dian)(dian)(dian)(dian)流(liu)；與傳(chuan)統(tong)測(ce)(ce)(ce)量(liang)(liang)方法(fa)相比，該方法(fa)測(ce)(ce)(ce)量(liang)(liang)過程中，測(ce)(ce)(ce)試儀無需(xu)和一次側直(zhi)接相連(lian)，因(yin)而試驗(yan)不存在危險(xian)性，無需(xu)做繁雜(za)的(de)安全工(gong)作(zuo)和等待(dai)冗(rong)長的(de)調(diao)度(du)命令，只需(xu)將(jiang)測(ce)(ce)(ce)量(liang)(liang)線接于PT的(de)開口(kou)三角(jiao)端子就可以測(ce)(ce)(ce)量(liang)(liang)出電(dian)(dian)(dian)(dian)容(rong)(rong)電(dian)(dian)(dian)(dian)流(liu)的(de)數據。從PT開口(kou)三角(jiao)處注入的(de)是(shi)微弱的(de)異頻測(ce)(ce)(ce)試信號(hao)(hao)，所以既不會對(dui)繼電(dian)(dian)(dian)(dian)保(bao)護和PT本身(shen)產生任何影(ying)響(xiang)，又避開了50Hz的(de)工(gong)頻干擾信號(hao)(hao)。

但是，現有的(de)(de)基于(yu)PT二次側注入信號法的(de)(de)測試(shi)儀(yi)體積及重量(liang)較大，便攜(xie)性較差不利于(yu)測試(shi)量(liang)較大的(de)(de)工況。

為解決(jue)這些問(wen)題(ti)，我(wo)公司在上一(yi)(yi)代(dai)基于PT二次側注入信號法測試(shi)(shi)儀(yi)(yi)的基礎上，經過重(zhong)新研發(fa)設計(ji)，開發(fa)出(chu)新一(yi)(yi)代(dai)手持式電(dian)(dian)容電(dian)(dian)流測試(shi)(shi)儀(yi)(yi)。采(cai)用全(quan)新硬件結構和速度更快(kuai)的ARM處理器及AD轉(zhuan)換器，內(nei)置(zhi)全(quan)新的全(quan)數字變頻(pin)逆變電(dian)(dian)源，將連個(ge)頻(pin)率(lv)的注入信號整(zheng)合為一(yi)(yi)個(ge)波形，采(cai)樣后再(zai)通過傅里(li)葉(xie)變換提取各個(ge)頻(pin)率(lv)的角度與幅值，因此一(yi)(yi)次測試(shi)(shi)就可得出(chu)測量(liang)(liang)數據。提高(gao)了測試(shi)(shi)效率(lv)。與前一(yi)(yi)代(dai)相比，新一(yi)(yi)代(dai)體(ti)積和重(zhong)量(liang)(liang)都大(da)大(da)減小，更加(jia)便于攜帶和現場測試(shi)(shi)。加(jia)入新的測量(liang)(liang)方法，以解決(jue)4PT連接方式電(dian)(dian)網(wang)電(dian)(dian)容電(dian)(dian)流測試(shi)(shi)精度不高(gao)的問(wen)題(ti)。

該測試儀采用工(gong)業(ye)彩色液晶(jing)屏（強(qiang)光下(xia)可讀）、中(zhong)文(wen)菜單、人機交(jiao)互(hu)更加(jia)友好，并且具備U盤(pan)存儲功(gong)能。接線簡(jian)單、測試速(su)度(du)快、測試穩定性(xing)和數據準確性(xing)高(gao)，大大減(jian)輕(qing)了(le)試驗(yan)人員的勞動強(qiang)度(du)，提高(gao)了(le)工(gong)作效率(lv)。

測量范(fan)圍(wei)更寬，測試(shi)速度更快。

工業級七(qi)寸彩色(se)液晶顯示屏，分(fen)辨(bian)率800×480點陣，強光下可讀。

人機交(jiao)互(hu)界面更加(jia)友好： 

具備多重零序過壓保護電路，測(ce)試儀(yi)輸出(chu)端可耐(nai)受AC100V 50HZ電壓而不損(sun)壞(huai)。

內置(zhi)全(quan)數字變頻(pin)逆變電源(yuan)，具有輸出(chu)頻(pin)率準確、輸出(chu)效(xiao)率高、發熱量小(xiao)、體積小(xiao)、重量輕、長(chang)時間工作穩定等特點(dian)。

具(ju)備(bei)輸出短路保護功能。

內置熱敏打(da)印機(ji)，方便用戶現場打(da)印數(shu)據。

具(ju)備實時(shi)時(shi)鐘，可實時(shi)顯示當前時(shi)間(jian)(jian)和日(ri)期；測量結果(guo)包括測量日(ri)期及時(shi)間(jian)(jian)。

測量數(shu)(shu)據(ju)存儲(chu)方式(shi)分為本機(ji)存儲(chu)和優盤存儲(chu)，本機(ji)存儲(chu)可(ke)存儲(chu)測量數(shu)(shu)據(ju)200條(tiao)。

便攜式(shi)、體積小、重量輕，方便攜帶使用。